CRITICAL ANALYSIS OF ELECTRICAL CONTACTS TO LAYERED SEMICONDUCTORS FOR USE IN (PHOTO)ELECTROCHEMICAL STUDIES

被引：6
作者：
ETMAN, M [1 ]
NEUMANNSPALLART, M [1 ]
机构：
[1] LAB PHYS SOLIDE, CNRS, F-92195 MEUDON, FRANCE
来源：
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1989年 / 269卷 / 02期
关键词：
D O I：
10.1016/0022-0728(89)85148-4
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：411 / 422
页数：12
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