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DAVIS DE, 1977, IBM J RES DEV, V21, P498, DOI 10.1147/rd.216.0498
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FOCUSED GA+ BEAM DIRECT IMPLANTATION FOR SI DEVICE FABRICATION
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INTEGRATED-CIRCUIT REPAIR USING FOCUSED ION-BEAM MILLING
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
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MICROMACHINING OF OPTICAL STRUCTURES WITH FOCUSED ION-BEAMS
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
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APPLICATION OF A FOCUSED ION-BEAM SYSTEM TO DEFECT REPAIR OF VLSI MASKS
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EFFECT OF RECOIL ATOMS ON RESOLUTION IN ION-BEAM LITHOGRAPHY
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SUB-MICRON PATTERN FABRICATION BY FOCUSED ION-BEAMS
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