SOME PROBLEMS ON RELIABILITY OF SEMICONDUCTOR INTEGRATED-CIRCUITS

被引：0
|
作者：
THUNEKI, S
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1972年 / 11卷 / 01期
关键词：
D O I：
10.1016/0026-2714(72)90822-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：52 / &
相关论文
共 50 条
  • [41] OPTOELECTRONIC INTEGRATED-CIRCUITS
    FORREST, SR
    PROCEEDINGS OF THE IEEE, 1987, 75 (11) : 1488 - 1497
  • [42] OPTOELECTRONIC INTEGRATED-CIRCUITS
    WILLIAMS, PJ
    CARTER, AC
    GEC JOURNAL OF RESEARCH, 1993, 10 (02): : 91 - 95
  • [43] LINEAR INTEGRATED-CIRCUITS
    HUFFMAN, G
    EDN MAGAZINE-ELECTRICAL DESIGN NEWS, 1980, 25 (04): : 96 - 103
  • [44] QUALIFICATION OF INTEGRATED-CIRCUITS
    WURNIK, F
    MICROELECTRONICS AND RELIABILITY, 1986, 26 (04): : 665 - 677
  • [45] LOGIC INTEGRATED-CIRCUITS
    MURRAY, J
    ENGINEERING, 1975, 215 (09): : R1 - R8
  • [46] INTEGRATED-CIRCUITS IN UK
    不详
    WIRELESS WORLD, 1973, 79 (1457): : 523 - 523
  • [47] SOCKETS FOR INTEGRATED-CIRCUITS
    GREENFIELD, D
    ELECTRONICS AND POWER, 1983, 29 (05): : 409 - 411
  • [48] SPYING ON INTEGRATED-CIRCUITS
    ANCEAU, F
    RECHERCHE, 1981, 12 (123): : 760 - 761
  • [49] NEW INTEGRATED-CIRCUITS
    STEIN, KU
    SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1979, 8 (05): : 249 - 250
  • [50] ENCAPSULATING INTEGRATED-CIRCUITS
    WHITE, ML
    BELL LABORATORIES RECORD, 1974, 52 (03): : 78 - 83
12345