SOME PROBLEMS ON RELIABILITY OF SEMICONDUCTOR INTEGRATED-CIRCUITS

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作者：

THUNEKI, S

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来源：

MICROELECTRONICS AND RELIABILITY | 1972年 / 11卷 / 01期

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D O I：

10.1016/0026-2714(72)90822-0

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TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：52 / &

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