PHOTOELECTRIC PROPERTIES OF EVAPORATED NICKEL FILMS - INFLUENCE OF FILM THICKNESS AND ANNEALING

被引：38
作者：
WEDLER, G
WOLFING, C
WISSMANN, P
机构：
来源：
SURFACE SCIENCE | 1971年 / 24卷 / 01期
关键词：
D O I：
10.1016/0039-6028(71)90237-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
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页码：302 / &
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