MECHANICAL-PROPERTIES OF THIN-FILMS

[1] Armstrong R. W., 1970, ADVANCES MATERIALS R, P101

[2] ULTRAMICROHARDNESS MEASUREMENTS ON ALUMINUM FILMS EVAPORATED UNDER VARIOUS CONDITIONS [J]. THIN SOLID FILMS, 1986, 137 (02) : 193 - 198

[3] BARNETT DM, 1987, COMMUNICATION

[4] GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 436 - 440

[5] ANALYSIS OF ELASTIC AND PLASTIC-DEFORMATION ASSOCIATED WITH INDENTATION TESTING OF THIN-FILMS ON SUBSTRATES [J]. INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1988, 24 (12) : 1287 - 1298

[6] RELAXATION OF STRAINED-LAYER SEMICONDUCTOR STRUCTURES VIA PLASTIC-FLOW [J]. APPLIED PHYSICS LETTERS, 1987, 51 (17) : 1325 - 1327

[7] A method for interpreting the data from depth-sensing indentation instruments [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) : 601 - 609

[8] Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (06) : 845 - 851

[9] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) : 126 - 131

[10] DOERNER MF, 1987, THESIS STANFORD U ST

[1] Armstrong R. W., 1970, ADVANCES MATERIALS R, P101

[2] ULTRAMICROHARDNESS MEASUREMENTS ON ALUMINUM FILMS EVAPORATED UNDER VARIOUS CONDITIONS [J]. THIN SOLID FILMS, 1986, 137 (02) : 193 - 198

[3] BARNETT DM, 1987, COMMUNICATION

[4] GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 436 - 440

[5] ANALYSIS OF ELASTIC AND PLASTIC-DEFORMATION ASSOCIATED WITH INDENTATION TESTING OF THIN-FILMS ON SUBSTRATES [J]. INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1988, 24 (12) : 1287 - 1298

[6] RELAXATION OF STRAINED-LAYER SEMICONDUCTOR STRUCTURES VIA PLASTIC-FLOW [J]. APPLIED PHYSICS LETTERS, 1987, 51 (17) : 1325 - 1327

[7] A method for interpreting the data from depth-sensing indentation instruments [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) : 601 - 609

[8] Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (06) : 845 - 851

[9] STRAIN DISTRIBUTION IN THIN ALUMINUM FILMS USING X-RAY DEPTH PROFILING [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (01) : 126 - 131

[10] DOERNER MF, 1987, THESIS STANFORD U ST