AUTOMATIC-GENERATION OF TEST VECTORS AT THE TRANSISTOR LEVEL

被引：0
|
作者：
ELMAIDI, E [1 ]
FLOTTES, ML [1 ]
LANDRAULT, C [1 ]
PRAVOSSOUDOVITCH, S [1 ]
机构：
[1] UNIV MONTPELLIER 2,LAB AUTOMAT & MICROELECTR MONTPELLIER,F-34060 MONTPELLIER,FRANCE
来源：
TSI-TECHNIQUE ET SCIENCE INFORMATIQUES | 1989年 / 8卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：583 / 591
页数：9
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