FREQUENCY-EFFECTS AND PROPERTIES OF PLASMA DEPOSITED FLUORINATED SILICON-NITRIDE

被引:11
作者
CHANG, CP
FLAMM, DL
IBBOTSON, DE
MUCHA, JA
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 02期
关键词
D O I
10.1116/1.584063
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:524 / 532
页数:9
相关论文
共 21 条
[1]  
ADAMS AC, 1986, PLASMA DEPOSITED THI, P129
[2]   SENSITIVE PHOTOTHERMAL DEFLECTION TECHNIQUE FOR MEASURING ABSORPTION IN OPTICALLY THIN MEDIA [J].
BOCCARA, AC ;
FOURNIER, D ;
JACKSON, W ;
AMER, NM .
OPTICS LETTERS, 1980, 5 (09) :377-379
[3]   FLUORINATED CHEMISTRY FOR HIGH-QUALITY, LOW HYDROGEN PLASMA-DEPOSITED SILICON-NITRIDE FILMS [J].
CHANG, CP ;
FLAMM, DL ;
IBBOTSON, DE ;
MUCHA, JA .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (04) :1406-1415
[4]  
CHEN ML, 1986, EDM LOS ANGELES, P256
[5]   OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) :3134-3136
[6]   DEPENDENCE OF F-ATOM DENSITY ON PRESSURE AND FLOW-RATE IN CF4 GLOW-DISCHARGES AS DETERMINED BY EMISSION-SPECTROSCOPY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02) :353-356
[7]   SPECTROSCOPIC DIAGNOSTICS OF CF4-O2 PLASMAS DURING SI AND SIO2 ETCHING PROCESSES [J].
DAGOSTINO, R ;
CRAMAROSSA, F ;
DEBENEDICTIS, S ;
FERRARO, G .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) :1259-1265
[8]   FREQUENCY-EFFECTS IN PLASMA-ETCHING [J].
FLAMM, DL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :729-738
[9]  
FLAMM DL, 1987, SOLID STATE TECHNOL, V30, P43
[10]   INVESTIGATION OF SURFACE PASSIVATION OF AMORPHOUS-SILICON USING PHOTOTHERMAL DEFLECTION SPECTROSCOPY [J].
FRYE, RC ;
KUMLER, JJ ;
WONG, CC .
APPLIED PHYSICS LETTERS, 1987, 50 (02) :101-103