MINIMOS-3 - A MOSFET SIMULATOR THAT INCLUDES ENERGY-BALANCE

被引:56
作者
HANSCH, W [1 ]
SELBERHERR, S [1 ]
机构
[1] VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
关键词
D O I
10.1109/T-ED.1987.23047
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1074 / 1078
页数:5
相关论文
共 25 条
[11]  
HANSCH W, 1986, S VLSI TECHNOL, P63
[12]  
HANSCH W, UNPUB
[13]  
HANSCH W, 1986, SOLID STATE SCI, V67, P296
[14]  
HOFFMANN KR, 1985, IEEE T ELECTRON DEV, V32, P691
[15]  
JAGGI R, 1969, HELV PHYS ACTA, V42, P941
[16]   1D ANALYTICAL TREATMENT OF HOT-ELECTRON EFFECTS IN SHORT-CHANNEL MOSFETS [J].
MIURAUSCH, M ;
DORDA, G .
PHYSICA B & C, 1985, 134 (1-3) :77-81
[18]  
PAASCH G, 1984, LADUNGSTRANSPORT INV
[19]  
REGGIANI L, 1985, TOPICS APPLIED PHYSI, V58
[20]   NOVEL HOT-ELECTRON EFFECTS IN THE CHANNEL OF MOSFETS OBSERVED BY CAPACITANCE MEASUREMENTS [J].
SCHMITTLANDSIEDEL, D ;
DORDA, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (07) :1294-1301