PHOTOELECTRIC MEASUREMENT AND STUDY OF DIAMOND-LIKE CARBON THIN-FILMS

被引：0
|
作者：
ROFAN, R
BOWER, R
KELLY, P
GETTY, J
机构：
[1] Department of Electrical and Computer Engineering, University of California, Davis, 95616, CA
来源：
JOURNAL OF ELECTRONIC MATERIALS | 1992年 / 21卷 / 01期
关键词：
PHOTOELECTRIC; DIAMOND-LIKE CARBON;
D O I：
10.1007/BF02670930
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Photoelectric threshold of diamond like carbon thin films was measured using both retarding potential and variable wavelength techniques. The photoelectric threshold was found to be 3.3 eV +/- 0.2 eV.
引用
收藏
页码：115 / 117
页数：3
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