PHOTOELECTRIC MEASUREMENT AND STUDY OF DIAMOND-LIKE CARBON THIN-FILMS

被引：0

作者：

ROFAN, R

BOWER, R

KELLY, P

GETTY, J

机构：

[1] Department of Electrical and Computer Engineering, University of California, Davis, 95616, CA

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1992年 / 21卷 / 01期

关键词：

PHOTOELECTRIC; DIAMOND-LIKE CARBON;

D O I：

10.1007/BF02670930

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Photoelectric threshold of diamond like carbon thin films was measured using both retarding potential and variable wavelength techniques. The photoelectric threshold was found to be 3.3 eV +/- 0.2 eV.

引用

页码：115 / 117

页数：3

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