APPLICATION OF SECONDARY ION MASS-SPECTROMETRY TO ADHESION STUDIES

被引：4
|
作者：
BRIGGS, D
机构：
来源：
JOURNAL OF ADHESION | 1987年 / 21卷 / 3-4期
关键词：
D O I：
10.1080/00218468708074980
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
引用
收藏
页码：343 / 352
页数：10
相关论文
共 50 条
  • [31] A MECHANISM OF ION PRODUCTION IN SECONDARY ION MASS-SPECTROMETRY
    KIDWELL, DA
    ROSS, MM
    COLTON, RJ
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1987, 78 : 315 - 328
  • [32] ION ENTHALPIES AND THEIR APPLICATION IN MASS-SPECTROMETRY
    MACCOLL, A
    ORGANIC MASS SPECTROMETRY, 1982, 17 (01): : 1 - 9
  • [33] SECONDARY ION MASS-SPECTROMETRY - A MULTIDIMENSIONAL TECHNIQUE
    COLTON, RJ
    KIDWELL, DA
    RAMSEYER, GO
    ROSS, MM
    ACS SYMPOSIUM SERIES, 1985, 291 : 160 - 193
  • [34] RECENT ADVANCES IN SECONDARY ION MASS-SPECTROMETRY
    EVANS, CA
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1979, (APR): : 127 - 127
  • [35] MATRIX EFFECTS IN SECONDARY ION MASS-SPECTROMETRY
    BUSCH, KL
    HSU, BH
    XIE, YX
    COOKS, RG
    ANALYTICAL CHEMISTRY, 1983, 55 (07) : 1157 - 1160
  • [36] SECONDARY ION MASS-SPECTROMETRY FOR CERAMIC MATERIALS
    BORCHARDT, G
    MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 1990, 21 (03) : 140 - 141
  • [37] SECONDARY-ION MASS-SPECTROMETRY AND GEOLOGY
    MACRAE, ND
    CANADIAN MINERALOGIST, 1995, 33 : 219 - 236
  • [38] SECONDARY ION MASS-SPECTROMETRY OF DISPIROTRIPIPERAZINIUM COMPOUNDS
    ANISIMOVA, OS
    SHEINKER, YN
    ORDZHONIKIDZE, S
    PLESHKOVA, AP
    ORGANIC MASS SPECTROMETRY, 1990, 25 (08): : 432 - 434
  • [39] A TEST APPARATUS FOR SECONDARY ION MASS-SPECTROMETRY
    KLAUS, N
    BROWN, JD
    CANADIAN JOURNAL OF PHYSICS, 1983, 61 (04) : 535 - 542
  • [40] DEPTH PROFILING BY SECONDARY ION MASS-SPECTROMETRY
    ZINNER, E
    SCANNING, 1980, 3 (02) : 57 - 78
12345