X-RAY-DIFFRACTION INVESTIGATION OF STRUCTURAL DISTORTION IN CRYSTALS WITH A DISTURBED SURFACE-LAYER

被引:0
|
作者
NIKOLAEV, VV
KHRUPA, VI
KRASULYA, SM
机构
来源
INDUSTRIAL LABORATORY | 1994年 / 60卷 / 03期
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D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An experimental method allowing the testing of defects in the bulk of single crystals with a surface layer damaged by mechanical treatment is described. The subject of the investigation were silicon crystals, grown by the crucibleless zone melting and Czochralski methods.
引用
收藏
页码:161 / 163
页数:3
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