BANDWIDTH FROM A LARGE EXCURSION OF GAUSSIAN-NOISE

被引：13
作者：
RAINAL, AJ
机构：
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1991年 / 40卷 / 04期
关键词：
D O I：
10.1109/19.85335
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Each large excursion of a stationary Gaussian process reveals the root-mean-square (rms) bandwidth of the underlying process. This paper presents some statistical properties of large excursions of Gaussian noise and then develops the exact asymptotic formulas for calculating the rms bandwidth of the underlying Gaussian process in terms of the excursion level, height, and duration. The measured trajectory of a large excursion is used to illustrate the method. A somewhat similar phenomenon occurs for the envelope of a narrow-band Gaussian process.
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页码：688 / 693
页数：6
相关论文
共 14 条
[1]   GAUSSIAN-NOISE .1. THE SHAPE OF LARGE EXCURSIONS [J].
BLACHMAN, NM .
IEEE TRANSACTIONS ON INFORMATION THEORY, 1988, 34 (06) :1396-1400
[2]  
Cramer H., 1967, STATIONARY RELATED S
[3]   LARGE EXCURSIONS OF GAUSSIAN-PROCESSES [J].
KAC, M ;
SLEPIAN, D .
ANNALS OF MATHEMATICAL STATISTICS, 1959, 30 (04) :1215-1228
[4]   ESTIMATING THE BANDWIDTH OF A NORMAL PROCESS FROM THE LEVEL-CROSSINGS OF ITS ENVELOPE [J].
KOMAILI, J ;
FERRARI, LA ;
SANKAR, PV .
IEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSING, 1987, 35 (10) :1481-1483
[5]  
LEADBETTER M. R., 1983, EXTREMES RELATED PRO
[6]   SPECTRAL MOMENT ESTIMATION BY MEANS OF LEVEL-CROSSINGS [J].
LINDGREN, G .
BIOMETRIKA, 1974, 61 (03) :401-418
[7]  
MAZO JE, 1990, 1121790020102TM INT
[8]   DETECTING A WEAK SINE WAVE AND MEASURING ITS PARAMETERS [J].
RAINAL, AJ .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1968, IM17 (02) :127-&
[9]   DURATION OF FADES ASSOCIATED WITH RADAR CLUTTER [J].
RAINAL, AJ .
BELL SYSTEM TECHNICAL JOURNAL, 1966, 45 (08) :1285-+
[10]  
RAINAL AJ, 1965, IEEE T INFORM THEORY, V11, P59
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