A NEW MICROTOME FOR ULTRATHIN SECTIONING FOR HIGH RESOLUTION ELECTRON MICROSCOPY

被引：118
|
作者：
SJOSTRAND, FS
机构：
来源：
EXPERIENTIA | 1953年 / 9卷 / 03期
关键词：
D O I：
10.1007/BF02178346
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：114 / 115
页数：2
相关论文
共 50 条
  • [21] A New Device for Serial Sectioning in Electron Microscopy
    Wakui, Shin
    Furusato, Masakuni
    Kano, Yutaka
    Ushigome, Shinichiro
    Microscopy, 1991, 40 (01) : 78 - 80
  • [22] NEW SECTIONING TECHNIQUES FOR LIGHT AND ELECTRON MICROSCOPY
    NEWMAN, SB
    BORYSKO, E
    SWERDLOW, M
    SCIENCE, 1949, 110 (2846) : 66 - 68
  • [23] Multifocus microscopy with optical sectioning and high axial resolution
    Strohl, Florian
    Hansen, Daniel Henry
    Grifo, Mireia Nager
    Birgisdottir, Asa Birna
    OPTICA, 2022, 9 (11): : 1210 - 1218
  • [24] Ultrathin sectioning of polymeric materials for low-voltage transmission electron microscopy
    Lednicky, F
    Hromádková, J
    Pientka, Z
    POLYMER, 2001, 42 (09) : 4329 - 4338
  • [25] Ultrathin carbon support films for high-resolution electron Microscopy of nanoparticles
    Kim, Young-Min
    Kang, Ji-Sun
    Kim, Ji-Soo
    Jeung, Jong-Man
    Lee, Jeong-Yong
    Kim, Youn-Joong
    MICROSCOPY AND MICROANALYSIS, 2007, 13 (04) : 285 - 290
  • [26] A METHOD TO IMPROVE CONTRAST IN HIGH RESOLUTION ELECTRON MICROSCOPY OF ULTRATHIN TISSUE SECTIONS
    SJOSTRAND, FS
    EXPERIMENTAL CELL RESEARCH, 1956, 10 (03) : 657 - 664
  • [27] Ultrathin sectioning of polymeric materials for low-voltage transmission electron microscopy:: Relief on ultrathin sections
    Lednicky, F
    Pientka, Z
    Hromádková, J
    JOURNAL OF MACROMOLECULAR SCIENCE-PHYSICS, 2003, B42 (05): : 1039 - 1047
  • [28] A SIMPLE NEW MICROTOME FOR ULTRA-THIN SECTIONING
    HODGE, AJ
    HUXLEY, HE
    SPIRO, D
    JOURNAL OF APPLIED PHYSICS, 1953, 24 (11) : 1415 - 1415
  • [29] A NEW DEVICE FOR SERIAL SECTIONING IN ELECTRON-MICROSCOPY
    WAKUI, S
    FURUSATO, M
    KANO, Y
    USHIGOME, S
    JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (01): : 78 - 80
  • [30] NEW APPROACHES IN HIGH-RESOLUTION ELECTRON MICROSCOPY
    FERNANDE.H
    JOURNAL OF APPLIED PHYSICS, 1966, 37 (10) : 3919 - &
12345