NON-DESTRUCTIVE THICKNESS GAUGING METHOD FOR THIN-LAYERS USING X-RAY-FLUORESCENCE

被引：0
|
作者：
CHESNEY, HL
PAPADAKIS, EP
BRINKERHOFF, J
机构：
[1] FORD MOTOR CO, ENGN & RES STAFF, PROD QUAL & INSPECT TECHNOL SECT, MFG PROCESSES LAB, DEARBORN, MI 48121 USA
[2] PANAMETRICS INC, DEPT MAT ANAL, WALTHAM, MA 02154 USA
来源：
MATERIALS EVALUATION | 1981年 / 39卷 / 08期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：726 / 738
页数：13
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