NON-DESTRUCTIVE THICKNESS GAUGING METHOD FOR THIN-LAYERS USING X-RAY-FLUORESCENCE

被引：0

作者：

CHESNEY, HL

PAPADAKIS, EP

BRINKERHOFF, J

机构：

[1] FORD MOTOR CO, ENGN & RES STAFF, PROD QUAL & INSPECT TECHNOL SECT, MFG PROCESSES LAB, DEARBORN, MI 48121 USA

[2] PANAMETRICS INC, DEPT MAT ANAL, WALTHAM, MA 02154 USA

来源：

MATERIALS EVALUATION | 1981年 / 39卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：726 / 738

页数：13

共 50 条

[1] APPLICATION OF X-RAY-FLUORESCENCE AS A NON-DESTRUCTIVE THICKNESS GAUGING METHOD FOR THIN COATINGS ON AUTOMOTIVE COMPONENTS
CHESNEY, HL
PAPADAKIS, EP
BRINKERHOFF, J
MATERIALS EVALUATION, 1979, 37 (10) : P14 - P14
[2] NON-DESTRUCTIVE DETERMINATION OF COMPOSITION AND THICKNESS OF MULTICOMPONENT ALLOY THIN-FILMS BY X-RAY-FLUORESCENCE SPECTROSCOPIC METHOD
CHENG, JB
CHENG, WR
WANG, XH
HAO, GZ
WU, ZC
CHINESE PHYSICS, 1983, 3 (03): : 606 - 610
[3] IMPROVED REPRODUCIBILITY IN X-RAY-FLUORESCENCE ANALYSIS OF THIN-LAYERS
METELEV, AY
ZELENSKII, YV
INDUSTRIAL LABORATORY, 1982, 48 (11): : 1096 - 1098
[4] NON-DESTRUCTIVE NUCLEAR METHOD FOR THE DETERMINATION OF CARBON IN THIN-LAYERS
BARIT, IJ
KAZANTSEV, AM
KUZMIN, LE
PRONMAN, IM
DOKLADY AKADEMII NAUK SSSR, 1982, 262 (01): : 95 - 98
[5] A NON-DESTRUCTIVE X-RAY METHOD FOR THE DETERMINATION OF THE THICKNESS OF SURFACE LAYERS
GAY, P
HIRSCH, PB
BRITISH JOURNAL OF APPLIED PHYSICS, 1951, 2 (AUG): : 218 - 222
[6] ANALYSIS OF THIN-LAYERS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
HOFFMANN, P
LIESER, KH
HEIN, M
FLAKOWSKI, M
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) : 471 - 476
[7] NON-DESTRUCTIVE METHOD OF GAUGING ELECTRODEPOSITED NICKEL LAYERS
REYNOLDS, PM
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1961, 38 (08): : 313 - &
[8] X-RAY-FLUORESCENCE ANALYSIS OF THIN-LAYERS AND DIFFUSION LAYERS ON SOME COPPER-ALLOYS
GRIMALDI, R
RANDI, G
METALLURGIA ITALIANA, 1974, 66 (11): : 601 - 604
[9] THICKNESS GAUGING THROUGH RATIO OF X-RAY-FLUORESCENCE LINES
ROSNER, B
NOTEA, A
SEGAL, Y
THIN SOLID FILMS, 1975, 27 (01) : 141 - 147
[10] APPLICATION OF THE METHOD OF THIN-LAYERS IN X-RAY-FLUORESCENCE - ANALYSIS OF LIQUID SAMPLES OF HYDROMETALLURGICAL TECHNOLOGIES IN THE PRODUCTION OF NON-FERROUS-METALS
VEVERKA, I
MALY, L
VIDMAR, A
CHEMICKE LISTY, 1987, 81 (10): : 1089 - 1096

← 1 2 3 4 5 →