ATOMIC-FORCE MICROSCOPY OF SOLUTION-GROWN POLYETHYLENE SINGLE-CRYSTALS

被引：21

作者：

NAKAGAWA, Y ^{[1
]}

HAYASHI, H ^{[1
]}

TAKAHAGI, T ^{[1
]}

SOEDA, F ^{[1
]}

ISHITANI, A ^{[1
]}

TODA, A ^{[1
]}

MIYAJI, H ^{[1
]}

机构：

[1] KYOTO UNIV,FAC SCI,DEPT PHYS,KYOTO 606,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 6B期

关键词：

POLYETHYLENE; SINGLE CRYSTAL; CRYSTAL GROWTH; FOLD SURFACE; ATOMIC FORCE MICROSCOPY;

D O I：

10.1143/JJAP.33.3771

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Atomic force microscopy (AFM) was applied to the precise thickness measurements of thin lamellae about 10 nm thick of polyethylene single crystals which were grown from dilute solutions and precipitated on cleaved mica. The obtained values agree well with the thickness determined by small angle X-ray scattering. Moreover, AFM observation allowed determination of the thickness difference of several angstroms in the different growth sectors of small crystals about several mum wide. From the measurements, it was concluded that the free energy of the fold surface in the {110} growth sector was 30% larger than the values in the {100} sector. The larger surface free energy in the {110} sector means higher fold energy in the growth sector.

引用

页码：3771 / 3774

页数：4

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