INSITU STUDIES OF ELECTROCHEMICAL INTERFACES BY GRAZING ANGLE X-RAY REFLECTION

被引：21
|
作者：
BOSIO, L
CORTES, R
FOLCHER, G
FROMENT, M
机构：
[1] TTPR15 CNRS “Physique des Liquides et Electrochimie”, E.S.P.C.I.
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1992年 / 139卷 / 08期
关键词：
D O I：
10.1149/1.2221187
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Measurements of the angular dependence of x-ray reflectivity from liquid Hg and Ga ranging up to several times the value of the critical angle can yield information about the mean electron density profile on the metal side of an electrochemical interface. As in the metal/vapor interface, our results suggest that the liquid metal/electrolyte interface is stratified for a few atomic layers when the metal is polarized at the zero charge potential.
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页码：2110 / 2114
页数：5
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