EXTENSION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPY BY USE OF DIFFRACTION INFORMATION

被引：8

作者：

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

关键词：

Compendex;

D O I：

10.1016/0304-3991(76)90039-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

CRYSTALS

引用

页码：255 / 262

页数：8

共 13 条

[1]

BUERGER MJ, 1959, VECTOR SPACE

[2]

Cowley J. M., 1976, Scanning Electron Microscopy 1976. I, P377

[3]

Cowley J.M., 1975, DIFFRACTION PHYS, V1

[4] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].

COWLEY, JM .

[5]

COWLEY JM, 1976, PRINCIPLES TECHNIQUE, V6, P40

[6]

COWLEY JM, 1976, 34TH ANN P EMSA

[7] A SCANNING MICROSCOPE WITH 5 A RESOLUTION [J].

CREWE, AV ;

WALL, J .

GOODMAN, P .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (NOV1) :804-&

[9] ELECTRON DIFFRACTION STUDY OF MGO HOO SYSTEMATIC INTERACTIONS [J].

GOODMAN, P ;

LEHMPFUHL, G .

[10]

GOODMAN P, IN PRESS