TEMPERATURE ANOMALIES OF SCHOTTKY-BARRIER DIODES ON N-TYPE SILICON

被引:5
作者
JAGER, D [1 ]
KASSING, R [1 ]
机构
[1] UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
关键词
D O I
10.1063/1.323401
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4413 / 4414
页数:2
相关论文
共 12 条
[1]   RICHARDSON CONSTANT OF AL-GAAS AND AU-GAAS SCHOTTKY-BARRIER DIODES [J].
BORREGO, JM ;
GUTMANN, RJ ;
ASHOK, S .
APPLIED PHYSICS LETTERS, 1977, 30 (03) :169-172
[2]   STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1589-+
[3]   PHYSICAL SIGNIFICANCE OF TO ANOMALIES IN SCHOTTKY BARRIERS [J].
CROWELL, CR .
SOLID-STATE ELECTRONICS, 1977, 20 (03) :171-175
[4]   ELECTRICAL PROPERTIES OF NICKEL-LOW-DOPED N-TYPE GALLIUM-ARSENIDE SCHOTTKY-BARRIER DIODES [J].
HACKAM, R ;
HARROP, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (12) :1231-+
[5]   EFFECT OF DEEP IMPURITY LEVELS ON SCHOTTKY-BARRIER DIODE CHARACTERISTICS [J].
KOROL, AN ;
KITSAI, MY ;
STRIKHA, VI ;
SHEKA, DI .
SOLID-STATE ELECTRONICS, 1975, 18 (05) :375-379
[6]   SCHOTTKY-BARRIER ANOMALIES AND INTERFACE STATES [J].
LEVINE, JD .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (10) :3991-+
[7]   EXPERIMENTAL STUDY OF GOLD-GALLIUM ARSENIDE SCHOTTKY BARRIERS [J].
PADOVANI, FA ;
SUMNER, GG .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3744-&
[8]  
PADOVANI FA, 1971, SEMICONDUCTOR SEMI A, V7
[9]  
PADVOANI FA, 1967, J APPL PHYS, V38, P891
[10]   DETAILED ANALYSIS OF METAL-SEMICONDUCTOR CONTACT [J].
PELLEGRINI, B .
SOLID-STATE ELECTRONICS, 1974, 17 (03) :217-237