BAYESIAN RELIABILITY-ANALYSIS FOR THE MED

被引：0

作者：

BHATTACHARYA, SK

SINGH, NK

机构：

[1] Department of Mathematics and Statistics, Allahabad University, Allahabad

来源：

MICROELECTRONICS AND RELIABILITY | 1994年 / 34卷 / 10期

关键词：

D O I：

10.1016/0026-2714(94)90052-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, Bayesian reliability analysis is carried out for a modified exponential distribution (MED) that is introduced hem, on the basis of failure times data x1 < x2 < ... < x(r), for a preassigned r1 and (n - r) survivors from this failure distribution. Under the assumptions of suitable prior densities on the parameter space and the squared error loss function (SELF), the Bayes estimators of the mean life and the reliability function are obtained.

引用

页码：1685 / 1687

页数：3

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