PHOTOMETER FOR QUANTITATIVE STRUCTURE-ANALYSIS OF SURFACES

A diffraction-reflex photometer for quantitative structure analysis of solid surfaces is described. The use of a photomultiplier allows modulation methods to be employed. The instrumental errors of the photometer are as follows: 0.5% for integrated intensity; +/- 0.05 mm for the space profile of the intensity distribution of a reflex; and +/- 0.01 eV for the energy profile of a reflex. The angular resolution is less-than-or-equal-to 0.3-degrees, the specimen-temperature range is 4-2800 K, and the recording time for an entire electron-diffraction pattern is less-than-or-equal-to 23 sec.