3-PROBE MICROSTRIP MEASURING SYSTEM FOR S-PARAMETER MEASUREMENTS

被引：0
|
作者：
LI, MY
CHANG, K
机构：
[1] Department of Electrical Engineering, Texas A&M University, College Station, Texas
来源：
ELECTRONICS LETTERS | 1991年 / 27卷 / 10期
关键词：
MEASUREMENT; MICROSTRIP; MICROWAVE MEASUREMENT;
D O I：
10.1049/el:19910524
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The three-probe scheme for input impedance measurement was modified for measuring the S-parameters of a two-port device. The method is simple, low cost and can be easily scaled to millimetre-wave frequencies. The measured results were verified by an automatic network analyser.
引用
收藏
页码：836 / 837
页数：2
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