3-PROBE MICROSTRIP MEASURING SYSTEM FOR S-PARAMETER MEASUREMENTS

被引：0

作者：

LI, MY

CHANG, K

机构：

[1] Department of Electrical Engineering, Texas A&M University, College Station, Texas

来源：

ELECTRONICS LETTERS | 1991年 / 27卷 / 10期

关键词：

MEASUREMENT; MICROSTRIP; MICROWAVE MEASUREMENT;

D O I：

10.1049/el:19910524

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The three-probe scheme for input impedance measurement was modified for measuring the S-parameters of a two-port device. The method is simple, low cost and can be easily scaled to millimetre-wave frequencies. The measured results were verified by an automatic network analyser.

引用

页码：836 / 837

页数：2

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