A MICROPROCESSOR BASED STI AUTOMATIC-MEASUREMENT SYSTEM

被引：0

作者：

SHAPIRA, S

TARTAKOVSKY, M

机构：

[1] LOEWENSTEIN REHABIL HOSP,INST OCCUPAT HLTH & REHABIL,RAANANA,ISRAEL

[2] TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL

来源：

PHYSICS IN MEDICINE AND BIOLOGY | 1980年 / 25卷 / 05期

关键词：

D O I：

暂无

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

引用

页码：981 / 981

页数：1

共 50 条

[1] MICROPROCESSOR-BASED SYSTEM FOR AUTOMATIC-MEASUREMENT OF CONCRETE RESISTIVITY
WILSON, JG
WHITTINGTON, HW
FORDE, MC
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (07): : 700 - 705
[2] AUTOMATIC-MEASUREMENT OF PENETRATION DEPTH IN SUPRACONDUCTORS USING A MICROPROCESSOR
IMFELD, NJ
EGLOFF, C
RINDERER, L
ZEITSCHRIFT FUR ANGEWANDTE MATHEMATIK UND PHYSIK, 1978, 29 (04): : 715 - 715
[3] AUTOMATIC-MEASUREMENT AND DISPLAYING SYSTEM OF FLATNESS
WADA, T
BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1980, 14 (02): : 113 - &
[4] AUTOMATIC-MEASUREMENT SYSTEM FOR PHOTOCAPACITOMETRY ANALYSIS
NISHIZAWA, J
KOIKE, M
DEZAKI, K
SHIBATA, J
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03): : 453 - 462
[5] AUTOMATIC-MEASUREMENT OF FLUCTUATIONS OF OPTICAL SOURCES BY MEANS OF A MICROPROCESSOR-CONTROLLED APPARATUS
DOCCHIO, F
PERANI, P
ZARAGA, F
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1982, 15 (02): : 240 - 242
[6] SYSTEM FOR AUTOMATIC-MEASUREMENT OF BEAM DIMENSIONS IN ELECTRON ACCUMULATOR
ZELINSKII, AY
TESLENKO, VV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1987, 30 (05) : 1056 - 1058
[7] DEVELOPING A BIG INSTRUMENT FROM AN AUTOMATIC-MEASUREMENT SYSTEM
SHAW, WC
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (03) : 194 - 197
[8] AN AUTOMATIC-MEASUREMENT OF GLASS THICKNESS
YAMAUCHI, H
NAKAYAMA, M
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 38-9 (MAY-) : 955 - 960
[9] AUTOMATIC-MEASUREMENT OF SOLIDIFICATION POINTS
HEUSSER, U
WIRZ, F
FETTE SEIFEN ANSTRICHMITTEL, 1979, 81 (06): : 251 - 253
[10] AUTOMATIC-MEASUREMENT ON NC LATHES
FELTEN, K
WERKSTATTSTECHNIK ZEITSCHRIFT FUR INDUSTRIELLE FERTIGUNG, 1978, 68 (10): : 625 - 630

← 1 2 3 4 5 →