THE MEASUREMENT OF THE SMALL-SIGNAL CHARACTERISTICS OF TRANSISTORS

被引:1
作者
COOKEYARBOROUGH, EH
STEPHEN, JH
机构
来源
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1954年 / 101卷 / 73期
关键词
D O I
10.1049/pi-3.1954.0071
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:288 / &
相关论文
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RYDER, RM ;
KIRCHER, RJ .
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[4]  
SHOCKLEY W, 1950, ELECTRONS HOLES SEMI, P67
[5]   CURRENT MULTIPLICATION IN THE TYPE-A TRANSISTOR [J].
SITTNER, WR .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (04) :448-454