TIME-RESOLVED REFLECTIVITY MEASUREMENTS DURING EXPLOSIVE CRYSTALLIZATION OF AMORPHOUS-SILICON

被引：30

作者：

BRUINES, JJP ^{[1
]}

VANHAL, RPM ^{[1
]}

BOOTS, HMJ ^{[1
]}

POLMAN, A ^{[1
]}

SARIS, FW ^{[1
]}

机构：

[1] FOM,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 18期

关键词：

D O I：

10.1063/1.97453

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1160 / 1162

页数：3

共 15 条

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[3]

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