CHEMICAL ATOMIC-ABSORPTION DETERMINATION OF 15 ELEMENTS IN POLYCRYSTALLINE SILICON

被引：0

作者：

KVARATSKHELI, YK

NIKITINA, ZA

ZHARKOVA, IP

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中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

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页码：1264 / 1268

页数：5

共 8 条

[1] USE OF HIGH-TEMPERATURE PRE-MIXED FLAMES IN ATOMIC ABSORPTION SPECTROSCOPY
AMOS, MD
WILLIS, JB
[J]. SPECTROCHIMICA ACTA, 1966, 22 (07): : 1325 - &
[2] DETERMINATION OF TRACE IMPURITIES IN SILICON AND CHLOROSILANES BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY AND NEUTRON-ACTIVATION ANALYSIS
CHU, CC
CHEN, PY
YANG, MH
ALFASSI, ZB
[J]. ANALYST, 1990, 115 (01) : 29 - 34
[3] KRASILSHCHIK VZ, 1988, VYSOKOCHH VESHCH, P156
[4] LEIFEROV BM, 1987, HIGH-PURITY SUBST, P147
[5] SAPRYKIN AI, 1987, VYSOKOCHH VESHCH, P150
[6] ZILBERSHTEIN KI, 1989, HIGH-PURITY SUBST, P159
[7] 1985, SILICON SEMICONDUCTO, P64
[8] 1985, SILICON SEMICONDUCTO, P5