EVALUATION OF SINGLE-CRYSTAL X-RAY-DIFFRACTION DATA FROM A POSITION-SENSITIVE DETECTOR

被引：1811
作者：
KABSCH, W
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷 / 06期
关键词：
Crystal rotations - Electronic pictures - Initialization step - Position-Sensitive Detectors - Single crystal diffraction data - Single crystal x-ray diffraction - Three-dimensional profiles - X-ray wavelengths;
D O I：
10.1107/S0021889888007903
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：916 / 924
页数：9
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