MEASURING SECONDARY-EMISSION CHARACTERISTICS OF DIELECTRICS AND SEMICONDUCTORS

被引：0

作者：

AFONINA, LF

STUCHINS.GB

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来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR | 1967年 / 02期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：458 / &

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[1] IMPROVEMENT OF PROCEDURE FOR MEASURING COEFFICIENT OF SECONDARY-EMISSION OF DIELECTRICS
MALYNIN, YG
SHERSTNE.LG
ORLOVSKI.VN
PRIBORY I TEKHNIKA EKSPERIMENTA, 1972, (05): : 173 - &
[2] SURFACE CHARGING OF DIELECTRICS BY SECONDARY-EMISSION AND THE DETERMINATION OF EMISSION YIELD
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VONSEGGERN, H
BERRAISSOUL, A
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1987, 22 (01): : 23 - 28
[3] THE SURFACE-POTENTIAL BARRIER IN SECONDARY-EMISSION FROM SEMICONDUCTORS
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[4] DIFFERENTIAL SECONDARY-EMISSION CHARACTERISTICS OF MICROCHANNEL PLATES
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EVDOKIMOV, AV
STOZHAROV, VM
TYUTIKOV, AM
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[5] COMPLEX STUDIES OF INTEGRAL SECONDARY-EMISSION CHARACTERISTICS
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[6] SECONDARY-EMISSION STUDIES OF HOT CARRIER RELAXATION IN POLAR SEMICONDUCTORS
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SOLID-STATE ELECTRONICS, 1988, 31 (3-4) : 419 - 424
[7] COMPARING SECONDARY-EMISSION CHARACTERISTICS OF MONOCRYSTALS AND POLYCRYSTALS
SHULMAN, AR
KORABLEV, VV
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IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1971, 35 (05): : 1060 - +
[8] SECONDARY-EMISSION SPECTRA AND ENERGY RELAXATION OF POLARITONS IN LAYER POLAR SEMICONDUCTORS
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PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1985, 131 (02): : 615 - 620
[9] SECONDARY-EMISSION QUANTITATIVE CHARACTERISTICS OF CHARGED AND EXCITED PARTICLES
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[10] SECONDARY-EMISSION CHARACTERISTICS OF CLEAN AND OXIDIZED ALUMINUM SURFACES
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