TECHNIQUE FOR HIGH-PRESSURE ELECTRICAL-CONDUCTIVITY MEASUREMENT IN DIAMOND ANVIL CELLS AT CRYOGENIC TEMPERATURES

被引：41

作者：

ERSKINE, D

YU, PY

MARTINEZ, G

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

[2] CNRS,SERV NATL CHAMPS INTENSES,F-38042 GRENOBLE,FRANCE

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 03期

关键词：

D O I：

10.1063/1.1139296

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：406 / 411

页数：6

共 19 条

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[8] PRESSURE-INDUCED SUPERCONDUCTIVITY IN HIGH-PRESSURE PHASES OF SI [J].

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[9] ELECTRICAL-RESISTIVITY MEASUREMENTS OF CONDUCTORS IN THE DIAMOND-WINDOW, HIGH-PRESSURE-CELL [J].

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[10]

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