GAAS AND IN0.53GA0.47AS MIS STRUCTURES HAVING AN ULTRATHIN PSEUDOMORPHIC INTERFACE CONTROL LAYER OF SI PREPARED BY MBE

被引:81
作者
HASEGAWA, H
AKAZAWA, M
MATSUZAKI, KI
ISHII, H
OHNO, H
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1988年 / 27卷 / 12期
关键词
D O I
10.1143/JJAP.27.L2265
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:L2265 / L2267
页数:3
相关论文
共 16 条
[1]   GAAS MIS STRUCTURES WITH SIO2 USING A THIN SILICON INTERLAYER [J].
FOUNTAIN, GG ;
HATTANGADY, SV ;
VITKAVAGE, DJ ;
RUDDER, RA ;
MARKUNAS, RJ .
ELECTRONICS LETTERS, 1988, 24 (18) :1134-1135
[2]   VARIATION OF N-GAAS (100) INTERFACE FERMI LEVEL BY GE AND SI OVERLAYERS [J].
GRANT, RW ;
WALDROP, JR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04) :1015-1019
[3]   HYBRID ORBITAL ENERGY FOR HETEROJUNCTION BAND LINEUP [J].
HASEGAWA, H ;
OHNO, H ;
SAWADA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1986, 25 (04) :L265-L268
[4]   ELECTRONIC AND MICROSTRUCTURAL PROPERTIES OF DISORDER-INDUCED GAP STATES AT COMPOUND SEMICONDUCTOR-INSULATOR INTERFACES [J].
HASEGAWA, H ;
HE, L ;
OHNO, H ;
SAWADA, T ;
HAGA, T ;
ABE, Y ;
TAKAHASHI, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04) :1097-1107
[5]   UNIFIED DISORDER INDUCED GAP STATE MODEL FOR INSULATOR-SEMICONDUCTOR AND METAL-SEMICONDUCTOR INTERFACES [J].
HASEGAWA, H ;
OHNO, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (04) :1130-1138
[6]   ON THE ELECTRICAL-PROPERTIES OF COMPOUND SEMICONDUCTOR INTERFACES IN METAL-INSULATOR SEMICONDUCTOR STRUCTURES AND THE POSSIBLE ORIGIN OF INTERFACE STATES [J].
HASEGAWA, H ;
SAWADA, T .
THIN SOLID FILMS, 1983, 103 (1-2) :119-140
[7]   CONTROL OF FERMI LEVEL PINNING AND RECOMBINATION PROCESSES AT GAAS-SURFACES BY CHEMICAL AND PHOTOCHEMICAL TREATMENTS [J].
HASEGAWA, H ;
ISHII, H ;
SAWADA, T ;
SAITOH, T ;
KONISHI, S ;
LIU, YA ;
OHNO, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (04) :1184-1192
[8]   A SELF-CONSISTENT COMPUTER-SIMULATION OF COMPOUND SEMICONDUCTOR METAL-INSULATOR-SEMICONDUCTOR C-V CURVES BASED ON THE DISORDER-INDUCED GAP-STATE MODEL [J].
HE, L ;
HASEGAWA, H ;
SAWADA, T ;
OHNO, H .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (06) :2120-2130
[9]  
JIAFANG, 1988, JPN J APPL PHYS, V27, pL1331
[10]  
KIM KH, 1988, 1988 INT C SOL STAT, P267