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SINUSOIDAL PHASE MODULATING INTERFEROMETER USING OPTICAL FIBERS FOR DISPLACEMENT MEASUREMENT
被引:54
作者
:
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
SASAKI, O
TAKAHASHI, K
论文数:
0
引用数:
0
h-index:
0
TAKAHASHI, K
机构
:
来源
:
APPLIED OPTICS
|
1988年
/ 27卷
/ 19期
关键词
:
D O I
:
10.1364/AO.27.004139
中图分类号
:
O43 [光学];
学科分类号
:
070207 ;
0803 ;
摘要
:
引用
收藏
页码:4139 / 4142
页数:4
相关论文
共 9 条
[1]
HIGH-PRECISION OPTICAL-SURFACE SENSOR
KOHNO, T
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
KOHNO, T
OZAWA, N
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
OZAWA, N
MIYAMOTO, K
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
MIYAMOTO, K
MUSHA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
MUSHA, T
[J].
APPLIED OPTICS,
1988,
27
(01):
: 103
-
108
[2]
LASER HETERODYNE MEASUREMENT OF SMALL ARBITRARY DISPLACEMENTS
OHTSUKA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
OHTSUKA, Y
SASAKI, I
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
SASAKI, I
[J].
OPTICS COMMUNICATIONS,
1974,
10
(04)
: 362
-
365
[3]
HETERODYNE PROFILING INSTRUMENT FOR THE ANGSTROM REGION
PANTZER, D
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
PANTZER, D
POLITCH, J
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
POLITCH, J
EK, L
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
EK, L
[J].
APPLIED OPTICS,
1986,
25
(22):
: 4168
-
4172
[4]
OPTICAL DETECTION OF AMPLITUDE AND PHASE OF MECHANICAL DISPLACEMENTS IN ANGSTROM RANGE
PUSCHERT, W
论文数:
0
引用数:
0
h-index:
0
机构:
AACHEN GMBH,PHILIPS FORSCH LAB,AACHEN,WEST GERMANY
AACHEN GMBH,PHILIPS FORSCH LAB,AACHEN,WEST GERMANY
PUSCHERT, W
[J].
OPTICS COMMUNICATIONS,
1974,
10
(04)
: 357
-
361
[5]
SINUSOIDAL PHASE MODULATING INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENT
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
OKAZAKI, H
[J].
APPLIED OPTICS,
1986,
25
(18)
: 3137
-
3140
[6]
ANALYSIS OF MEASUREMENT ACCURACY IN SINUSOIDAL PHASE MODULATING INTERFEROMETRY
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
OKAZAKI, H
[J].
APPLIED OPTICS,
1986,
25
(18)
: 3152
-
3158
[7]
SINUSOIDAL PHASE MODULATING INTERFEROMETER USING THE INTEGRATING-BUCKET METHOD
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
OKAZAKI, H
SAKAI, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
SAKAI, M
[J].
APPLIED OPTICS,
1987,
26
(06)
: 1089
-
1093
[8]
OPTICAL HETERODYNE PROFILOMETRY
SOMMARGREN, GE
论文数:
0
引用数:
0
h-index:
0
SOMMARGREN, GE
[J].
APPLIED OPTICS,
1981,
20
(04):
: 610
-
618
[9]
OPTICAL HETERODYNE MEASUREMENT OF IN-PLANE VIBRATIONS
UEHA, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
UEHA, S
SHIOTA, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
SHIOTA, K
论文数:
引用数:
h-index:
机构:
OKADA, T
TSUJIUCH.J
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TSUJIUCH.J
[J].
OPTICS COMMUNICATIONS,
1974,
10
(01)
: 88
-
90
←
1
→
共 9 条
[1]
HIGH-PRECISION OPTICAL-SURFACE SENSOR
KOHNO, T
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
KOHNO, T
OZAWA, N
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
OZAWA, N
MIYAMOTO, K
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
MIYAMOTO, K
MUSHA, T
论文数:
0
引用数:
0
h-index:
0
机构:
MECH ENGN LAB, SAKURA, IBARAKI 305, JAPAN
MUSHA, T
[J].
APPLIED OPTICS,
1988,
27
(01):
: 103
-
108
[2]
LASER HETERODYNE MEASUREMENT OF SMALL ARBITRARY DISPLACEMENTS
OHTSUKA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
OHTSUKA, Y
SASAKI, I
论文数:
0
引用数:
0
h-index:
0
机构:
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
HOKKAIDO UNIV,FAC ENGN,DEPT ENGN SCI,SAPPORO,JAPAN
SASAKI, I
[J].
OPTICS COMMUNICATIONS,
1974,
10
(04)
: 362
-
365
[3]
HETERODYNE PROFILING INSTRUMENT FOR THE ANGSTROM REGION
PANTZER, D
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
PANTZER, D
POLITCH, J
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
POLITCH, J
EK, L
论文数:
0
引用数:
0
h-index:
0
机构:
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
ROYAL INST TECHNOL,S-10044 STOCKHOLM 70,SWEDEN
EK, L
[J].
APPLIED OPTICS,
1986,
25
(22):
: 4168
-
4172
[4]
OPTICAL DETECTION OF AMPLITUDE AND PHASE OF MECHANICAL DISPLACEMENTS IN ANGSTROM RANGE
PUSCHERT, W
论文数:
0
引用数:
0
h-index:
0
机构:
AACHEN GMBH,PHILIPS FORSCH LAB,AACHEN,WEST GERMANY
AACHEN GMBH,PHILIPS FORSCH LAB,AACHEN,WEST GERMANY
PUSCHERT, W
[J].
OPTICS COMMUNICATIONS,
1974,
10
(04)
: 357
-
361
[5]
SINUSOIDAL PHASE MODULATING INTERFEROMETRY FOR SURFACE PROFILE MEASUREMENT
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
OKAZAKI, H
[J].
APPLIED OPTICS,
1986,
25
(18)
: 3137
-
3140
[6]
ANALYSIS OF MEASUREMENT ACCURACY IN SINUSOIDAL PHASE MODULATING INTERFEROMETRY
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
OKAZAKI, H
[J].
APPLIED OPTICS,
1986,
25
(18)
: 3152
-
3158
[7]
SINUSOIDAL PHASE MODULATING INTERFEROMETER USING THE INTEGRATING-BUCKET METHOD
SASAKI, O
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
SASAKI, O
OKAZAKI, H
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
OKAZAKI, H
SAKAI, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
TOKYO SEIMITSU CO LTD, RES & DEV, TOKYO, JAPAN
SAKAI, M
[J].
APPLIED OPTICS,
1987,
26
(06)
: 1089
-
1093
[8]
OPTICAL HETERODYNE PROFILOMETRY
SOMMARGREN, GE
论文数:
0
引用数:
0
h-index:
0
SOMMARGREN, GE
[J].
APPLIED OPTICS,
1981,
20
(04):
: 610
-
618
[9]
OPTICAL HETERODYNE MEASUREMENT OF IN-PLANE VIBRATIONS
UEHA, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
UEHA, S
SHIOTA, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
SHIOTA, K
论文数:
引用数:
h-index:
机构:
OKADA, T
TSUJIUCH.J
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MEGURO,TOKYO,JAPAN
TSUJIUCH.J
[J].
OPTICS COMMUNICATIONS,
1974,
10
(01)
: 88
-
90
←
1
→