NONDESTRUCTIVE CHARACTERIZATION OF CHROMIUM PHOSPHATE COATED ALUMINUM WITH SE AND FTIRS CORRELATED TO SURFACE ANALYTICAL ANALYSES BY AES AND TEM

被引：7

作者：

GOEMINNE, G

DELAET, J

TERRYN, H

VEREECKEN, J

机构：

[1] Department of Metallurgy, Electrochemistry and Materials Science Vrije Universiteit Brussel (VUB), Brussels, B-1050

来源：

SURFACE AND INTERFACE ANALYSIS | 1994年 / 22卷 / 1-12期

关键词：

D O I：

10.1002/sia.740220195

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Non-destructive optical investigations (SE and FTIRS) of chromium phosphate conversion layers on aluminum are correlated to AES and TEM investigations. The AES results support the duplex model of the structure. FTIR-spectra provide a non-destructive characterization in agreement with the Auger data. Fitting the SE-data with a proper model makes it possible to determine the thickness accurately. A correlation is made between the thickness obtained with SE, FTIRS and AES. It is shown that for thin layers a good agreement is obtained.

引用

页码：445 / 450

页数：6

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