DEPTH PROFILE OF CONCENTRATION OF DEEP-LEVEL IMPURITIES IN VAPOR-PHASE EPITAXIAL GALLIUM-ARSENIDE GROWN UNDER VARIOUS ARSENIC VAPOR-PRESSURES

被引:33
作者
OKAMOTO, H
SAKATA, S
SAKAI, K
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, MUSASHINO ELECTR COMMUN LAB, MUSASHINO, TOKYO, JAPAN
[2] UNIV TOKYO, INST IND SCI, MINATO, TOKYO, JAPAN
关键词
D O I
10.1063/1.1662347
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1316 / 1326
页数:11
相关论文
共 40 条
[1]  
BAN US, 1971, J ELECTROCHEM SOC, V118, P1473
[2]   INTERPRETATION OF ANOMALOUS LAYERS AT GAAS N+-N- STEP JUNCTIONS [J].
BLOCKER, TG ;
COX, RH ;
HASTY, TE .
SOLID STATE COMMUNICATIONS, 1970, 8 (16) :1313-&
[3]  
BOLGER DE, 1967, 3 I PHYS PHYS SOC C, P16
[4]  
CAIRNS B, 1968, J ELECTROCHEM SOC, V115, pC327
[5]   PREPARATION OF EPITAXIAL GAXIN1-XAS [J].
CONRAD, RW ;
HOYT, PL ;
MARTIN, DD .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (2P1) :164-&
[6]   PREPARATION OF HIGH PURITY EPITAXIAL GALLIUM ARSENIDE FROM ELEMENTS [J].
CONRAD, RW ;
REYNOLDS, RA ;
JEFFCOAT, MW .
SOLID-STATE ELECTRONICS, 1967, 10 (05) :507-&
[7]   A TECHNIQUE FOR DIRECTLY PLOTTING INVERSE DOPING PROFILE OF SEMICONDUCTOR WAFERS [J].
COPELAND, JA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (05) :445-&
[8]   RECOMBINATION VELOCITY EFFECTS ON CURRENT DIFFUSION AND IMREF IN SCHOTTKY BARRIERS [J].
CROWELL, CR ;
BEGUWALA, M .
SOLID-STATE ELECTRONICS, 1971, 14 (11) :1149-&
[10]   EFFECTS OF ASCL3 MOLE FRACTION ON INCORPORATION OF GERMANIUM, SILICON, SELENIUM, AND SULFUR INTO VAPOR GROWN EPITAXIAL LAYERS OF GAAS [J].
DILORENZO, JV ;
MOORE, GE .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (11) :1823-+