AUGER SPECTROSCOPY OF SILICON

被引：43

作者：

BISHOP, HE

RIVIERE, JC

TAYLOR, NJ

机构：

来源：

SURFACE SCIENCE | 1969年 / 17卷 / 02期

关键词：

D O I：

10.1016/0039-6028(69)90117-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：462 / &

共 10 条

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[6]

SIEGBAHN K, 1967, ATOMIC MOLECULAR SOL

[7] THIN REACTION LAYERS AND SURFACE STRUCTURE OF SILICON(111) [J].

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[8]

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[9] LEED STUDY OF A NICKEL INDUCED SURFACE STRUCTURE ON SILICON (3) [J].

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SURFACE SCIENCE, 1967, 8 (04) :467-+

[10] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J].

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