ELECTRICAL CHARACTERISTICS OF (100), (111), AND RANDOMLY ALIGNED LEAD-ZIRCONATE-TITANATE THIN-FILMS

被引：52

作者：

KIM, CJ ^{[1
]}

YOON, DS ^{[1
]}

LEE, JS ^{[1
]}

CHOI, CG ^{[1
]}

LEE, WJ ^{[1
]}

NO, K ^{[1
]}

机构：

[1] KOREA ADV INST SCI & TECHNOL,DEPT ELECTR MAT SCI & ENGN,TAEJON 305701,SOUTH KOREA

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 11期

关键词：

D O I：

10.1063/1.358467

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

(100), (111), and randomly aligned lead zirconate titanate thin films on Pt/Ti/Corning 7059 glass substrates were prepared using a sol-gel method. The thin films, having different alignments, were fabricated by different drying conditions for pyrolysis. The hysteresis loop and the capacitance-voltage characteristics were investigated using a standardized ferroelectric test system. The dielectric constant and the current-voltage characteristics of the films were investigated using an impedance analyzer and a pA meter, respectively. The microstructure was investigated using scanning electron microscopy. The (100) aligned film showed a relatively larger dielectric constant than the (111) and the randomly aligned films. The films aligned in particular directions showed higher hysteresis parameters than the randomly aligned film. The leakage current densities of the films aligned in particular directions were lower than that of the randomly aligned film. © 1994 American Institute of Physics.

引用

页码：7478 / 7482

页数：5

共 18 条

[1]

BELLUR KR, 1992, ISAF S P, V8, P448

[2] EPITAXIAL-GROWTH AND PROPERTIES OF YBA2CU3OX-PB(ZR0.6TI0.4)O3-YBA2CU3OX TRILAYER STRUCTURE BY LASER ABLATION [J].

BOIKOV, YA ;

ESAYAN, SK ;

IVANOV, ZG ;

BRORSSON, G ;

CLAESON, T ;

LEE, J ;

SAFARI, A .

APPLIED PHYSICS LETTERS, 1992, 61 (05) :528-530

[3]

GAO Y, 1993, MATER RES SOC S P, V310, P235

[4]

HELLWEGE KH, 1981, FERROELECTRICS OXIDE, V3, P16

[5]

KAO KC, 1981, ELECT TRANSPORT SOLI, pCH3

[6]

Kim C., UNPUB

[7] EFFECTS OF SUBSTRATE AND BOTTOM ELECTRODES ON THE PHASE-FORMATION OF LEAD-ZIRCONATE-TITANATE THIN-FILMS PREPARED BY THE SOL-GEL METHOD [J].

KIM, CJ ;

YOON, DS ;

LEE, JS ;

CHOI, CG ;

NO, KS .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (5A) :2675-2678

[8]

LEE HY, 1984, IEEE T COMPON HYBR, V7, P443, DOI 10.1109/TCHMT.1984.1136375

[9]

LI S, 1992, ISAF S P, V401

[10]

OKAZAKI K, 1992, CERAMIC ENG DIELECTR, P188

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