DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER

被引：19

作者：

BROWNING, R ^{[1
]}

BASSETT, PJ ^{[1
]}

ELGOMATI, MM ^{[1
]}

PRUTTON, M ^{[1
]}

机构：

[1] UNIV YORK, DEPT PHYS, HESLINGTON YO1 5DD, YORKSHIRE, ENGLAND

来源：

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES | 1977年 / 357卷 / 1689期

关键词：

D O I：

10.1098/rspa.1977.0164

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：213 / +

共 22 条

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[18] THEORETICAL COMPARISON OF ELECTRON-ENERGY ANALYZERS DEGRADED SO AS TO OBTAIN HIGH SENSITIVITY [J].

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[19]

REDHEAD PA, 1968, PHYSICAL BASIS ULTRA

[20]

SEAH MP, 1973, 1973 NEWC TYN I PHYS

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