DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER

被引：19

作者：

BROWNING, R ^{[1
]}

BASSETT, PJ ^{[1
]}

ELGOMATI, MM ^{[1
]}

PRUTTON, M ^{[1
]}

机构：

[1] UNIV YORK, DEPT PHYS, HESLINGTON YO1 5DD, YORKSHIRE, ENGLAND

来源：

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES | 1977年 / 357卷 / 1689期

关键词：

D O I：

10.1098/rspa.1977.0164

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：213 / +

共 22 条

[1] IMPROVED AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES [J].

BASSETT, PJ .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (06) :461-463

[2] HIGH-ENERGY RESOLUTION AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES [J].

BASSETT, PJ ;

GALLON, TE ;

PRUTTON, M .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (10) :1008-&

[3] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].

BISHOP, HE ;

RIVIERE, JC .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&

[4]

BISHOP HE, 1974, AERE7899 MAT DEV DIV

[5]

BOOKER GR, 1970, MODERN DIFFRACTION I

[6] ELECTRON GUN USING A FIELD EMISSION SOURCE [J].

CREWE, AV ;

EGGENBER.DN ;

WALL, J ;

WELTER, LM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) :576-&

[7]

GRYZINSKI M, 1965, PHYS REV A, V138, P305

[8]

HARRIS LA, 1971, 71C273 REP

[9] AUGER-ELECTRON EMISSION MICROGRAPHIC STUDIES OF CLEAVAGE SURFACE OF GRAPHITE SINGLE-CRYSTAL [J].

HAYAKAWA, K ;

OKANO, H ;

KAWASE, S ;

YAMAMOTO, S .

JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) :2575-2579

[10]

HOUSTON JE, 1974, REV SCI INSTRUM, V45, P897, DOI 10.1063/1.1686763

← 1 2 3 →