APPLICATION OF SECONDARY-ELECTRON CHANNEL MULTIPLIERS TO SCANNING ELECTRON MICROSCOPY

被引：10

作者：

HUGHES, KA

SULWAY, DV

WAYTE, RC

THORNTON, PR

机构：

来源：

关键词：

D O I：

10.1063/1.1709247

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4922 / &

共 6 条

[1]

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EVERHART, TE ;

THORNLEY, RFM .

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[3]

KIMOTO S, 1966, ELECTRON MICROPROBE, P480

[4]

MCKINLEY T, 1966, ELECTRON MICROPRO ED, P480

[5] AN IMPROVED SCANNING ELECTRON MICROSCOPE FOR OPAQUE SPECIMENS [J].

MCMULLAN, D ;

THEWLIS, J ;

AGAR, AW ;

GABOR, D ;

HAINE, ME ;

LUBSZYNSKI, HG ;

FEINBERG, R ;

MCMULLAN, D .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1953, 100 (75) :245-259

[6]

Oatley C.W., 1957, J ELECTRON CONTR, V2, P568