A METHOD FOR MEASURING THERMAL-RADIATION PROPERTIES OF SEMITRANSPARENT MATERIALS

被引:4
|
作者
ZHANG, YP
GE, XS
HUANG, HL
机构
[1] Dept. of Eng. Thermophys., Univ. of Sci. and Technol. of China, Hefei
关键词
D O I
10.1088/0957-0233/5/9/005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Films that are semi-transparent in the infrared are extensively used in solar energy applications and agriculture. For analysing the performance of such systems, it is important to know the thermal radiation properties of these films. Whereas transmissivity can be determined easily, measurement of emissivity poses a problem. The intensity usually consists of radiation emitted from the film and transmitted background radiation. In this paper a method for determining the hemispherical total emittance, reflectance and transmittance of semi-transparent films simultaneously is presented. It has the distinctive features of simplicity and high precision. The results for some transparent films are presented.
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页码:1061 / 1064
页数:4
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