OPTICAL-CONSTANT CALCULATION OVER AN EXTENDED SPECTRAL REGION - APPLICATION TO TITANIUM-DIOXIDE FILM

被引:36
作者
CHIAO, SC
BOVARD, BG
MACLEOD, HA
机构
[1] Optical Sciences Center, University of Arizona, Tucson, AZ
[2] Westford, MA, 01886-0016
来源
APPLIED OPTICS | 1995年 / 34卷 / 31期
关键词
D O I
10.1364/AO.34.007355
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An iterative algorithm has been developed that takes starting values derived by an envelope method but then minimizes the influence of the envelopes and emphasizes the actual measured data. This combination avoids the difficulties inherent in the accurate drawing of the envelopes and makes it possible to extract the thickness and the optical constants of semiconducting and dielectric films over a wide spectral region, including regions of high absorption. (C) 1995 Optical Society of America
引用
收藏
页码:7355 / 7360
页数:6
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