Interaction of atomic force microscope tip with ripples in graphene nanoribbons

被引：1

作者：

Baimova, J. A. ^{[1
,2
]}

Zhou, K. ^{[2
]}

机构：

[1] RAS, Inst Met Superplast Problems, Khalturin St 39, Ufa 450001, Russia

[2] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore

来源：

LETTERS ON MATERIALS-PIS MA O MATERIALAKH | 2012年 / 2卷 / 03期

关键词：

graphene; ripples; atomic force microscopy; simulation;

D O I：

10.22226/2410-3535-2012-3-139-142

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Physical properties of graphene nanoribbons can be changed in a controllable way by introducing ripples via application of homogeneous elastic strain. Atomic force microscopy is a popular method used for measuring parameters of ripples in graphene sheets. In this letter, the interaction between atomic force microscope tip and ripples in graphene nanoribbons with clamped edges is investigated. With the help of molecular dynamics simulations, the displacements in graphene nanoribbon as the function of force acting from the tip were calculated for different positions of the tip with respect to the nanoribbons edge.

引用

页码：139 / 142

页数：4