LS1 - A COMPUTER-PROGRAM FOR SIMULTANEOUS REFINEMENT OF MATERIAL STRUCTURE AND MICROSTRUCTURE

被引：252

作者：

LUTTEROTTI, L ^{[1
]}

SCARDI, P ^{[1
]}

MAISTRELLI, P ^{[1
]}

机构：

[1] UNIV TRENTO,DIPARTIMENTO FIS,I-38050 TRENT,ITALY

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1992年 / 25卷

关键词：

D O I：

10.1107/S0021889892001122

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A computer program has been written to introduce profile analysis into the Rietveld method. The devised algorithm simultaneously refines both structural and microstructural parameters, also accounting for anisotropy in crystallite size and microstrain, Instead of using phenomenological relations to describe the trend of profile width and shape as a function of diffraction angle, a model based on the Warren-Averbach approach has been developed that permits extraction of more information from data, also achieving faster convergence.

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页码：459 / 462

页数：4

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