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MEASUREMENT OF X-RAY-INDUCED ELECTRON-EMISSION
被引:4
作者
:
AEBY, CA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEW MEXICO,ALBUQUERQUE,NM 87131
UNIV NEW MEXICO,ALBUQUERQUE,NM 87131
AEBY, CA
[
1
]
WHAN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV NEW MEXICO,ALBUQUERQUE,NM 87131
UNIV NEW MEXICO,ALBUQUERQUE,NM 87131
WHAN, GA
[
1
]
机构
:
[1]
UNIV NEW MEXICO,ALBUQUERQUE,NM 87131
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1981年
/ 28卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1981.4335697
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:4177 / 4181
页数:5
相关论文
共 4 条
[1]
AEBY CA, 1980, XRAY INDUCED ELECTRO
[2]
ABSOLUTE YIELDS OF X-RAY INDUCED PHOTOEMISSION FROM METALS
BRADFORD, JN
论文数:
0
引用数:
0
h-index:
0
机构:
USAF, CAMBRIDGE RES LABS, LG HANSCOM FIELD, BEDFORD, MA 01730 USA
USAF, CAMBRIDGE RES LABS, LG HANSCOM FIELD, BEDFORD, MA 01730 USA
BRADFORD, JN
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1972,
NS19
(06)
: 167
-
171
[3]
X-RAY-INDUCED ELECTRON-EMISSION FROM METALS
DOLAN, KW
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, LIVERMORE, CA 94550 USA
SANDIA LABS, LIVERMORE, CA 94550 USA
DOLAN, KW
[J].
JOURNAL OF APPLIED PHYSICS,
1975,
46
(06)
: 2456
-
2463
[4]
ROGERS S, 1976, DNA4062T DEF NUCL AG
←
1
→
共 4 条
[1]
AEBY CA, 1980, XRAY INDUCED ELECTRO
[2]
ABSOLUTE YIELDS OF X-RAY INDUCED PHOTOEMISSION FROM METALS
BRADFORD, JN
论文数:
0
引用数:
0
h-index:
0
机构:
USAF, CAMBRIDGE RES LABS, LG HANSCOM FIELD, BEDFORD, MA 01730 USA
USAF, CAMBRIDGE RES LABS, LG HANSCOM FIELD, BEDFORD, MA 01730 USA
BRADFORD, JN
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1972,
NS19
(06)
: 167
-
171
[3]
X-RAY-INDUCED ELECTRON-EMISSION FROM METALS
DOLAN, KW
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, LIVERMORE, CA 94550 USA
SANDIA LABS, LIVERMORE, CA 94550 USA
DOLAN, KW
[J].
JOURNAL OF APPLIED PHYSICS,
1975,
46
(06)
: 2456
-
2463
[4]
ROGERS S, 1976, DNA4062T DEF NUCL AG
←
1
→