TARGET CHAMBER FOR CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE STUDIES

被引：8

作者：

FELDL, EJ

UMBARGER, CJ

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 103卷 / 02期

关键词：

D O I：

10.1016/0029-554X(72)90393-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：341 / &

共 10 条

[1]

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CLOSE, DA ;

BEARSE, RC .

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[3]

DARDIS TA, 1971, B AM PHYS SOC, V16, P1171

[4] SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION [J].

FLOCCHINI, RG ;

FEENEY, PJ ;

SOMMERVILLE, RJ ;

CAHILL, TA .

NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03) :397-+

[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].

JOHANSSON, TB ;

AKSELSSON, R ;

JOHANSSON, SA .

NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+

[6]

KRAUSHAAR JJ, 1971, B AM PHYS SOC, V16, P545

[7]

MARION JB, 1968, NUCLEAR REACTION ANA, P136

[8]

PERRY S, 1972, B AM PHYS SOC, V17, P120

[9]

UMBARGER CJ, 1972, B AM PHYS SOC, V17, P88

[10] INVESTIGATION OF ANALYTICAL CAPABILITIES OF X-RAY EMISSION INDUCED BY HIGH ENERGY ALPHA PARTICLES [J].

WATSON, RL ;

SJURSETH, JR ;

HOWARD, RW .

NUCLEAR INSTRUMENTS & METHODS, 1971, 93 (01) :69-&

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