STRUCTURE, GROWTH AND ORIENTATION OF VACUUM DEPOSITED TELLURIUM FILMS

被引：24

作者：

CAPERS, MJ

WHITE, M

机构：

来源：

THIN SOLID FILMS | 1971年 / 8卷 / 05期

关键词：

D O I：

10.1016/0040-6090(71)90080-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：317 / &

共 14 条

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[2]

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[5] EXTRA REFLECTIONS IN ELECTRON DIFFRACTION PATTERNS FROM POLYCRYSTALLINE AND SINGLE CRYSTAL SELENIUM FILMS [J].

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SANG, H .

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[6]

GUTIERREZ WA, 1962, B AM PHYS SOC, V7, P588

[7] FORMATION OF IMPERFECTIONS IN EPITAXIAL GOLD FILMS [J].

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STOWELL, MJ .

PHILOSOPHICAL MAGAZINE, 1966, 13 (121) :129-&

[8] ELEKTRISCHE UND OPTISCHE EIGENSCHAFTEN VON AMORPHEM TELLUR [J].

KELLER, H ;

STUKE, J .

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[9]

LAFOURCADE L, 1966, J MICROSC-PARIS, V5, P537

[10]

OANCHA CG, 1963, SOV PHYS CRYSTALLOGR, V7, P451

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