REVERSE CURRENT AND CARRIER LIFETIME AS A FUNCTION OF TEMPERATURE IN SILICON JUNCTION DIODES

被引：21

作者：

PELL, EM

ROE, GM

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1956年 / 27卷 / 07期

关键词：

D O I：

10.1063/1.1722480

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：768 / 772

页数：5

共 12 条

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[9] REVERSE CURRENT AND CARRIER LIFETIME AS A FUNCTION OF TEMPERATURE IN GERMANIUM JUNCTION DIODES [J].

PELL, EM .

JOURNAL OF APPLIED PHYSICS, 1955, 26 (06) :658-665

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