EPSILON-EXPANSION FOR INTERFACIAL PROFILE

被引:51
作者
RUDNICK, J [1 ]
JASNOW, D [1 ]
机构
[1] UNIV PITTSBURGH,DEPT PHYS & ASTRON,PITTSBURGH,PA 15260
来源
PHYSICAL REVIEW B | 1978年 / 17卷 / 03期
关键词
D O I
10.1103/PhysRevB.17.1351
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The profile for the diffuse interface separating two coexisting phases in a scalar (n=1) system is calculated to first order in ε=4-d. The lowest-order result is the renormalized Landau-Ginzburg expression. The O(ε) correction is small even at ε=1. A preliminary comparison with the experimental reflectivity measurements of Huang and Webb is made. Special difficulties involving the case d<̃3 are discussed. © 1978 The American Physical Society.
引用
收藏
页码:1351 / 1354
页数:4
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